Friday, July 26
3:15-5:15 PM

Dewetting of Thin Solid Films

The dewetting of epitaxial thin films of solid deposited on substrates occurs in microelectronic and optoelectronic devices. Dewetting can occur when an initially planar thin film forms a hole exposing the substrate. This hole grows via mass flow along the surface of the film. The morphological stability of the dewetting film is not well understood. The speakers in this minisymposium will present recent numerical, analytical and experimental work. They will discuss the effects of capillarity, elasticity, thermodynamics, anisotropy and contact-angle dynamics on the morphological evolution of the film and the formation of island shapes, cracks, and dislocations.

Organizers: Michael J. Miksis and Stephen H. Davis
Northwestern University

3:15 Morphological Instabilities in Thin Films: Surface Roughness, Agglomeration and Hillocks
David J. Srolovitz, University of Michigan, Ann Arbor
3:45 Equilibrium Shapes of Islands in Strained Solid Films
Brian Spencer, SUNY-Buffalo; and Jerry Tersoff, IBM T.J. Watson Research Center
4:15 Formation of Cracks and Dislocations by Surface Diffusion in Heteroepitaxial Thin Films
Huajian Gao, Stanford University
4:45 The Stability of Solid Films
J.E. Guyer and H. Wong, Northwestern University; Sephen H. Davis and Michael J. Miksis, Organizers; and Peter W. Voorhees, Northwestern University

Registration | Hotel Information | Transportation | Speaker Index | Program Overview

MMD, 5/20/96