Monday, July 14

10:30 AM-12:30 PM
Law School, Room 180

MS5
Least Squares and Related Problems in Metrology (Part I of II)

Metrology is measurement science. Coordinate metrology is a discipline of dimensional metrology used in many technical and scientific processes. It is the key for maintaining and improving the quality in manufacturing. In computer-aided inspection a part is measured by a coordinate measuring system yielding a set of data points. The problem then is to find a best-fit geometric element to the data set, i.e., to determine the geometric and position/orientation parameters of the part. Least-squares fits are often used for the purpose of minimizing the geometric distances of the fitted element from the measured points. Mathematical tools and software support in metrology are still to be developed and improved. Some of the methods used are orthogonal distance progression, total least squares, implicit least squares, and Chebychev fits. This minisymposium will focus on some best-fit and related problems in metrology.

Organizer: Walter Gander
ETH-Zentrum, Switzerland

10:30 Problems in Computational Metrology

Vijay Srinivasan, IBM T. J. Watson Research Center

11:00 Least Squares Problems in Coordinate Metrology

Walter Gander, Organizer

11:30 A Separation-of-Variables Approach to Generalized Distance Regression

Alistair B. Forbes, National Physical Laboratory, United Kingdom

12:00 B-Spline Curve and Surface Fitting with Applications in Coordinate Metrology

Daniel S. Zwick, Double Star Research, Germany; and Hans-Peter Helfrich, University of Bonn, Germany

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