CP24
Statistics and Applications

5:30 Statistical Summation for Efficient Radar Cross Section Prediction

Ned J. Corron, Dynetics, Inc., Huntsville, AL

5:45 Controlling an Automated Inspection System with Force and Visual Sensing

Kelly A. Korzeniowski, United States Naval Academy

6:00 Tolerance Intervals for the Normal Distribution

Jack Tomsky, Lockheed Missiles and Space Company, Palo Alto

6:15 When Models Lie: Beware of Non-Random Patterns from Random Number Generators

Keith W. Miller and Chung-Hsein Sung, Sangamon State University

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